Röntgendiffraktometer

Fraunhofer Gesellschaft zur Förderung der angewandten Forschung e.V. über Vergabeportal deutsche eVergabe

The aim of the announced multipurpose x-ray diffractometer is the structural analysis of semiconductors and thin films. The device needs to measure high resolution rocking curves (Omega-2Theta-scans) and reciprocal space maps of various semiconductor mate-rials where the focus lies on throughput. Additionally, x-ray reflectivity measurements must be possible to determine the layer thicknesses of thin film samples. Switching between the measurements need to be quick and reproducible without time-consuming conversions and alignment routines. The sample holder should be able to fit a semiconductor wafer with a size of up to 6”, whereby a xy-sample stage should be able map/scan the full area of a 4” wafer. The diffractometer needs a 4-circle geometry, preferably a Eulerian cradle. The exact technical details have to be evaluated and discussed again with the supplier of the X-ray diffractometer.

Deadline

Die Frist für den Eingang der Angebote war 2019-11-04. Die Ausschreibung wurde veröffentlicht am 2019-10-02.

Anbieter

Die folgenden Lieferanten werden in Vergabeentscheidungen oder anderen Beschaffungsunterlagen erwähnt:

Wer? Wie? Wo?
Geschichte der Beschaffung
Datum Dokument
2019-10-02 Auftragsbekanntmachung
2020-05-20 Bekanntmachung über vergebene Aufträge
Auftragsbekanntmachung (2019-10-02)
Objekt
Umfang der Beschaffung
Titel: Nichtmedizinische Röntgenausrüstung
Referenznummer: E_035_338967 cl-meer
Kurze Beschreibung:
The aim of the announced multipurpose x-ray diffractometer is the structural analysis of semiconductors and thin films. The device needs to measure high resolution rocking curves (Omega-2Theta-scans) and reciprocal space maps of various semiconductor mate-rials where the focus lies on throughput. Additionally, x-ray reflectivity measurements must be possible to determine the layer thicknesses of thin film samples. Switching between the measurements need to be quick and reproducible without time-consuming conversions and alignment routines. The sample holder should be able to fit a semiconductor wafer with a size of up to 6”, whereby a xy-sample stage should be able map/scan the full area of a 4” wafer. The diffractometer needs a 4-circle geometry, preferably a Eulerian cradle. The exact technical details have to be evaluated and discussed again with the supplier of the X-ray diffractometer.
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Metadaten der Bekanntmachung
Originalsprache: Englisch 🗣️
Dokumenttyp: Auftragsbekanntmachung
Art des Auftrags: Lieferungen
Verordnung: Europäische Union, mit GPA-Beteiligung
Gemeinsames Vokabular für öffentliche Aufträge (CPV)
Code: Nichtmedizinische Röntgenausrüstung 📦
Ort der Leistung
NUTS-Region: Freiburg 🏙️

Verfahren
Verfahrensart: Verhandlungsverfahren
Angebotsart: Angebot für alle Lose
Vergabekriterien
Wirtschaftlichstes Angebot

Öffentlicher Auftraggeber
Identität
Land: Deutschland 🇩🇪
Art des öffentlichen Auftraggebers: Sonstiges
Name des öffentlichen Auftraggebers: Fraunhofer Gesellschaft zur Förderung der angewandten Forschung e.V. über Vergabeportal deutsche eVergabe
Postanschrift: Hansastr. 27c
Postleitzahl: 80686
Postort: München
Kontakt
Internetadresse: http://www.fraunhofer.de 🌏
E-Mail: fraunhofer@deutsche-evergabe.de 📧
URL der Dokumente: http://www.deutsche-evergabe.de 🌏
URL der Teilnahme: http://www.deutsche-evergabe.de 🌏

Referenz
Daten
Absendedatum: 2019-10-02 📅
Einreichungsfrist: 2019-11-04 📅
Veröffentlichungsdatum: 2019-10-04 📅
Kennungen
Bekanntmachungsnummer: 2019/S 192-465908
ABl. S-Ausgabe: 192
Zusätzliche Informationen
Request of documents — available at: the award documents can be retrieved Exclusively through the award portal of the German e-Vergabe at www.deutsche-evergabe.de With the tender submission, contenders are also subject to the provisions regarding unsuccessful tenders (§134 GWB [German Act Against Restraints of Competition]). Questions or remarks from the tenderer must be sent, in English only, exclusively via e-mail to the contact point named under No. I.1. As far as relevant, responses to the questions or remarks of the tenderer shall also be sent to all other tenderers. Pursuant to Section 9 Par. 3 S. 2 VgV (German public procurement regulation), the contract notice and the award documents are available to you at the German eVergabe with or without registration. Please note that registration is required for requests to participate, tender submissions and tenderer questions. We therfore recommend early registration, also in order to receive any tenderer information; you otherwise bear the risk of possible tender exclusion.
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Objekt
Umfang der Beschaffung
Kurze Beschreibung:
The aim of the announced multipurpose x-ray diffractometer is the structural analysis of semiconductors and thin films. The device needs to measure high resolution rocking curves (Omega-2Theta-scans) and reciprocal space maps of various semiconductor mate-rials where the focus lies on throughput. Additionally, x-ray reflectivity measurements must be possible to determine the layer thicknesses of thin film samples. Switching between the measurements need to be quick and reproducible without time-consuming conversions and alignment routines. The sample holder should be able to fit a semiconductor wafer with a size of up to 6”, whereby a xy-sample stage should be able map/scan the full area of a 4” wafer. The diffractometer needs a 4-circle geometry, preferably a Eulerian cradle. The exact technical details have to be evaluated and discussed again with the supplier of the X-ray diffractometer. Further the system needs to be equipped with software to display, evaluate and export the measurement data and software tools to simulate and fit X-ray reflection and diffraction patterns.
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Dauer: 6 Monate
Beschreibung der Optionen: Warranty extension from 12 months should offered optional.
Ort der Leistung
Hauptstandort oder Erfüllungsort: 79110 Freiburg.

Rechtliche, wirtschaftliche, finanzielle und technische Informationen
Bedingungen für die Teilnahme
Befähigung zur Berufsausübung:
The documents listed below must be presented in full with the offer. Incomplete documents may lead to the exclusion of the proceedings.
Wirtschaftliche und finanzielle Leistungsfähigkeit:
1) Company profile and the actual amount of employees;
2) Designation of the company revenue for the last 3 business years;
3) Self-declaration regarding the lack of exclusion criteria pursuant to § 123 and § 124 of the German Act Against Restraints of Competition (GWB);
4) Excerpt from the Central Trade Register according to § 150a GewO (is requested by the client).
Technische und berufliche Fähigkeiten:
1) Complete references (including contact persons with contact data) from comparable projects, which were realized in the last 3 years.
Auftragsausführung
Bedingungen für die Vertragserfüllung:
In the event that subcontractors are used, they must be named and their suitability is likewise to be substantiated on the basis of the listed documents under III.1). Furthermore, it must be confirmed that they will be available if the order is placed; their share in the scope of the contractual object must be stated.
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Verfahren
Rechtsgrundlage: 32014L0024
Mindestzahl der Bewerber: 3
Höchstzahl der Bewerber: 5
Objektive Kriterien für die Auswahl der begrenzten Anzahl von Bewerbern: According eligibility criteria, references.
Zeitpunkt des Eingangs der Angebote: 23:59
Sprachen, in denen Angebote oder Teilnahmeanträge eingereicht werden können: Deutsch 🗣️
Englisch 🗣️

Öffentlicher Auftraggeber
Identität
Andere Art des öffentlichen Auftraggebers: Forschungsgesellschaft e. V.
Kontakt
Adresse des Käuferprofils: http://www.deutsche-evergabe.de 🌏
Dokumente URL: http://www.deutsche-evergabe.de 🌏

Referenz
Zusätzliche Informationen
Request of documents — available at: the award documents can be retrieved
Exclusively through the award portal of the German e-Vergabe at www.deutsche-evergabe.de
With the tender submission, contenders are also subject to the provisions regarding unsuccessful tenders (§134 GWB [German Act Against Restraints of Competition]). Questions or remarks from the tenderer must be sent, in English only, exclusively via e-mail to the contact point named under No. I.1. As far as relevant, responses to the questions or remarks of the tenderer shall also be sent to all other tenderers.
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Pursuant to Section 9 Par. 3 S. 2 VgV (German public procurement regulation), the contract notice and the award documents are available to you at the German eVergabe with or without registration.
Please note that registration is required for requests to participate, tender submissions and tenderer questions.
We therfore recommend early registration, also in order to receive any tenderer information; you otherwise bear the risk of possible tender exclusion.

Ergänzende Informationen
Körper überprüfen
Name: Vergabekammer des Bundes beim Bundeskartellamt
Postanschrift: Villemombler Straße 76
Postort: Bonn
Postleitzahl: 53123
Land: Deutschland 🇩🇪
Informationen zu Fristen für Nachprüfungsverfahren:
A request for review is inadmissible if more than 15 calendar days have passed since the receipt of the notification from the ordering party indicating a lack of willingness to help with the objection (§ 160 Par. 3 Clause 1 No 4 GWB <German Act Against Restraints of Competition>). A request for review is additionally inadmissible if the contract has been awarded before the Vergabekammer <procurement review authority> has informed the ordering party of the request for review (§§ 168 Par. 2 Clause 1, 169 Par. 1 GWB). The award of the contract is possible 15 calendar days after the dispatch of the tenderer information pursuant to § 134 Par. 1 GWB. If the information is sent electronically or via fax, this time period is reduced to ten calendar days (§ 134 Par. 2 GWB). The time period begins on the day after the dispatch of the information by the ordering party; the day on which it is received at the concerned tenderer and applicant is not relevant. The admissibility of a request for review furthermore presupposes that a complaint has been made to the ordering party with regard to the asserted procurement violations within 10 days after knowledge was obtained of it (§ 160 Par. 3 Clause 1 No 1 GWB). Complaints regarding violations of procurement rules that are apparent on the basis of the announcement must be made to the ordering party before the expiration of the time period named in the announcement for the application or for the tendering (§ 160 Par. 3 Clause 1 No 1 GWB). Complaints regarding violations of procurement rules that do not become apparent until appearing in the award documents must be made to the ordering party no later than by the expiration of the time period for the application or for the tendering (§ 160 Par. 3 Clause 1 No 1 GWB).
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Dienststelle, bei der Informationen über das Überprüfungsverfahren eingeholt werden können
Name: Fraunhofer Gesellschaft zur Förderung der angewandten Forschung e.V. über Vergabeportal eVergabe
Postanschrift: Hansastraße 27c
Postort: München
Postleitzahl: 80686
E-Mail: einkauf@zv.fraunhofer.de 📧
Internetadresse: http://www.fraunhofer.de 🌏
Quelle: OJS 2019/S 192-465908 (2019-10-02)
Bekanntmachung über vergebene Aufträge (2020-05-20)
Objekt
Umfang der Beschaffung
Kurze Beschreibung:
The aim of the announced multipurpose X-ray diffractometer is the structural analysis of semiconductors and thin films. The device needs to measure high resolution rocking curves (Omega-2Theta-scans) and reciprocal space maps of various semiconductor mate-rials where the focus lies on throughput. Additionally, X-ray reflectivity measurements must be possible to determine the layer thicknesses of thin film samples. Switching be-tween the measurements need to be quick and reproducible without time-consuming conversions and alignment routines. The sample holder should be able to fit a semicon-ductor wafer with a size of up to 6”, whereby a xy-sample stage should be able map/scan the full area of a 4” wafer. The diffractometer needs a four-circle geometry, preferably a Eulerian cradle. The exact technical details have to be evaluated and dis-cussed again with the supplier of the x-ray diffractometer.
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Gesamtwert des Auftrags: 0.01 EUR 💰
Metadaten der Bekanntmachung
Dokumenttyp: Bekanntmachung über vergebene Aufträge

Verfahren
Angebotsart: Entfällt
Vergabekriterien
Niedrigster Preis

Referenz
Daten
Absendedatum: 2020-05-20 📅
Veröffentlichungsdatum: 2020-05-25 📅
Kennungen
Bekanntmachungsnummer: 2020/S 100-240402
Verweist auf Bekanntmachung: 2019/S 192-465908
ABl. S-Ausgabe: 100
Zusätzliche Informationen
— request of documents — available at: The award documents can be retrieved exclusively through the award portal of the German e-Vergabe at www.deutsche-evergabe.de. With the tender submission, contenders are also subject to the provisions regarding unsuccessful tenders (§134 GWB [German Act Against Restraints of Competition]). Questions or remarks from the tenderer must be sent, in English only, exclusively via e-mail to the contact point named under No I.1. As far as relevant, responses to the questions or remarks of the tenderer shall also be sent to all other tenderers. Pursuant to Section 9 Par. 3 S. 2 VgV (German public procurement regulation), the contract notice and the award documents are available to you at the German eVergabe with or without registration. Please note that registration is required for requests to participate, tender submissions and tenderer questions. We therefore recommend early registration, also in order to receive any tenderer information; you otherwise bear the risk of possible tender exclusion.
Mehr anzeigen

Objekt
Umfang der Beschaffung
Kurze Beschreibung:
The aim of the announced multipurpose X-ray diffractometer is the structural analysis of semiconductors and thin films. The device needs to measure high resolution rocking curves (Omega-2Theta-scans) and reciprocal space maps of various semiconductor mate-rials where the focus lies on throughput. Additionally, X-ray reflectivity measurements must be possible to determine the layer thicknesses of thin film samples. Switching be-tween the measurements need to be quick and reproducible without time-consuming conversions and alignment routines. The sample holder should be able to fit a semicon-ductor wafer with a size of up to 6”, whereby a xy-sample stage should be able map/scan the full area of a 4” wafer. The diffractometer needs a four-circle geometry, preferably a Eulerian cradle. The exact technical details have to be evaluated and discussed again with the supplier of the x-ray diffractometer. Further the system needs to be equipped with software to display, evaluate and export the measurement data and software tools to simulate and fit X-ray reflection and diffraction patterns.
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Auftragsvergabe
Datum des Vertragsabschlusses: 2020-04-29 📅
Name: Malvern PANalytical GmbH
Postort: Kassel
Land: Deutschland 🇩🇪
Kassel, Kreisfreie Stadt 🏙️
Gesamtwert des Auftrags: 0.01 EUR 💰
Informationen über Ausschreibungen
Anzahl der eingegangenen Angebote: 2

Öffentlicher Auftraggeber
Identität
Andere Art des öffentlichen Auftraggebers: Research company e. V.

Referenz
Zusätzliche Informationen
— request of documents — available at: The award documents can be retrieved exclusively through the award portal of the German e-Vergabe at www.deutsche-evergabe.de. With the tender submission, contenders are also subject to the provisions regarding unsuccessful tenders (§134 GWB [German Act Against Restraints of Competition]). Questions or remarks from the tenderer must be sent, in English only, exclusively via e-mail to the contact point named under No I.1. As far as relevant, responses to the questions or remarks of the tenderer shall also be sent to all other tenderers.
Mehr anzeigen
We therefore recommend early registration, also in order to receive any tenderer information; you otherwise bear the risk of possible tender exclusion.

Ergänzende Informationen
Körper überprüfen
Informationen zu Fristen für Nachprüfungsverfahren:
A request for review is inadmissible if more than 15 calendar days have passed since the receipt of the notification from the ordering party indicating a lack of willingness to help with the objection (§ 160 Par. 3 Clause 1 No 4 GWB <German Act Against Restraints of Competition>). A request for review is additionally inadmissible if the contract has been awarded before the Vergabekammer <procurement review authority> has informed the ordering party of the request for review (§§ 168 Par. 2 Clause 1, 169 Par. 1 GWB). The award of the contract is possible 15 calendar days after the dispatch of the tenderer information pursuant to § 134 Par. 1 GWB. If the information is sent electronically or via fax, this time period is reduced to ten calendar days (§ 134 Par. 2 GWB). The time period begins on the day after the dispatch of the information by the ordering party; the day on which it is received at the concerned tenderer and applicant is not relevant. The admissibility of a request for review furthermore presupposes that a complaint has been made to the ordering party with regard to the asserted procurement violations within 10 days after knowledge was obtained of it(§ 160 Par. 3 Clause 1 No 1 GWB). Complaints regarding violations of procurement rules that are apparent on the basis of the announcement must be made to the ordering party before the expiration of the time period named in the announcement for the application or for the tendering (§ 160 Par. 3 Clause 1 No 1 GWB). Complaints regarding violations of procurement rules that do not become apparent until appearing in the award documents must be made to the ordering party no later than by the expiration of the time period for the application or for the tendering (§ 160 Par. 3 Clause 1 No. 1 GWB).
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Quelle: OJS 2020/S 100-240402 (2020-05-20)
Neue Beschaffungen in verwandten Kategorien 🆕
Verwandte Suchen 🔍
Region:
Deutschland Baden-Württemberg Freiburg Bayern Oberbayern München, Kreisfreie Stadt
Produkte/Dienstleistungen:
Laborgeräte, optische Geräte und... Apparate und Geräte zum Prüfen und Testen Nichtmedizinische Röntgenausrüstung