Jüngste Beschaffungen durch Lehrstuhl für Technische Physik E23, TUM
2025-10-09Two Cryogen-free Dilution Refrigerators (Lehrstuhl für Technische Physik E23, TUM)
The Technical University (TUM) of Munich Chair of Technical Physics (E23) will acquire two Cryogen-free Dilution Refrigerators for carrying out research on superconducting quantum systems at mK temperatures at the Zentrum für Quantum Engineering. The systems must satisfy the technical specifications required for the planned research. 1. System 1 must have a large sample space to accommodate the intended experiments including signal processing, sufficiently large cooling power at the different temperature …
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2025-10-07Cryogen-free Dilution Refrigerator with Optics (Lehrstuhl für Technische Physik E23, TUM)
The Walther-Meißner-Institute will acquire a Cryogen-free Dilution Refrigerator for carrying out research on solid-state quantum systems at mK temperatures. The system must satisfy the technical specifications required in the "Leistungsbeschreibung". In particular, it must have a vector magnet and a large sample space to accommodate the intended experiments, sufficiently large cooling power at the different temperature stages, and a large number of microwave input and output lines, as well as free-space …
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2025-07-03Cryogen-free Dilution Refrigerator with Vector Magnet (Lehrstuhl für Technische Physik E23, TUM)
The Walther-Meißner-Institute will acquire a Cryogen-free Dilution Refrigerator for carrying out research on solid-state quantum systems at mK temperatures. The system must satisfy the technical specifications required in the "Leistungsbeschreibung". In particular, it must have a vector magnet and a large sample space to accommodate the intended experiments, sufficiently large cooling power at the different temperature stages, and a large number of microwave input and output lines, as well as free-space …
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2025-04-11XPS (Lehrstuhl für Technische Physik E23, TUM)
The Walther-Meißner-Institute will acquire an X-ray/Ultraviolet Photoelectron Spectroscopy (XPS/UPS) system for the characterization of metallic, semiconducting, and insulating thin films, and bulk materials. This includes the characterization of substrate surfaces, characterization of oxide layers by measuring the chemical shift and valence state, determining the oxide layer thickness using angle-resolved XPS, stoichiometry analysis of thin film samples, depth profiling of chemical composition, and …
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